NDP References for 1993 - 1994

1994 Literature

Neutron Depth Profiling at Nuclear Physics Instititute Rez, J. Vacík, J. Červená, V. Hnatowicz, V. Havránek and D. Fink, Acta Physica Hungarica,Volume 75, Numbers 1-4, 369-372 (1994)

Baker, Shenda M., Wu, K., Smith, G.S., Hubbard, K.M., Mastasi, M., Downing, R.G., and Lamaze, G.P., “Self-diffusion of isotopically pure boron examined by neutron reflectometry and neutron depth profiling,” Proc. Mat. Res. Soc.: Neutron Scattering in Material Science II, Boston, MA, 26 Nov. 1994

DOI: http://dx.doi.org/10.1557/PROC-376-209

Thermal desorption of helium irradiated beryllium studied by THDS, NDP, PA and SEM, H. Eleveld, A. van Veen, F. Labohm and M. W. de Moor, Journal of Nuclear Materials, Volumes 212-215, Part 2, September 1994, Pages 971-975.

Physical properties of a-C: N films produced by ion beam assisted deposition, Francois Rossi, Bernard Andre, A. van Veen, P. E. Mijnarends, H. Schut, and F. Labohm, Hugh Dunlop, Marie Paule Delplancke, Kevin Hubbard, J. Mater. Res., Vol. 9, No. 9, pages 2440-2449. September 1994

Physical properties of nitrogenated amorphous carbon films produced by ion-beam-assisted deposition, François Rossi, Bernard Andre, A. van Veen, P. E. Mijnarends, H. Schut, F. Labohm, Marie Paule Delplancke, Hugh Dunlop and Eric Anger, Thin Solid Films, Volume 253, Issues 1-2, 15 December 1994, Pages 85-89

Neutron depth profiling at the University of Texas, Kenan Uuml;nlü and Bernard W. Wehring, Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Volume 353, Issues 1-3, 30 December 1994, Pages 402-405

Ion track doping, D. Fink, L. T. Chadderton, S. A. Cruz, W. R. Fahrner, V. Hnatowicz, E. H. Te Kaat, A. A. Melnikov, V. S. Varichenko & A. M. Zaitsev, Radiation Effects and Defects in Solids: Incorporating Plasma Science and Plasma Technology, Volume 132, Issue 2, 1994, pages 81-90

Analysis of cubic boron nitride thin films by neutron depth profiling, G. P. Lamaze, R. G. Downing, L. B. Hackenberger, L. J. Pilione and R. Messier, Diamond and Related Materials, Volume 3, Issues 4-6, April 1994, Pages 728-731

On the lithium uptake of MeV ion irradiated polymer foils from a LiCI solution, D. Fink, V. Hnatowicz, J. Vacík & L. T. Chadderton, Radiation Effects and Defects in Solids: Incorporating Plasma Science and Plasma Technology, Volume 132, Issue 1, (1994) pages 1-10

Boron and Nitrogen Analysis in CVD Diamond Surfaces Using Cold Neutron Depth Profiling, Lamaze, G.P., Badzian, A., Badzian, T, Pilione, L, and Downing, R.G., Advances in New Diamond Science and Technology, Fourth International Conference on the New Diamond Science and Technology, (1994) pages 341-344

Effect of stoichiometery on the phases present in boron nitride thin films, L. B. Hackenberger, L. J. Pilione, R Messier, and G.P. Lamaze, Journal of Vacuum Science and Technology A, Vol 12 (4) Pages 1569-1575 (1994)

New Approaches for Neutron Depth Profiling, Schweikert, E. A., Welsh, J. F., Journal of Radioanalytical and Nuclear Chemistry, Articles, Vol. 180, No. 2 (1994) pages 255-262

Solid and liquid phase doping of energetic ion tracks in polymers, D. Fink, H. Omichi, F. Hosoi, M. Tamada, V. Hnatowicz, V. Vacik, L.T. Chadderton, R. Klett, Editor(s): I. Yamada, H. Ishiwara, E. Kamijo, T. Kawai, C.W. Allen, C.W. White, Laser and Ion Beam Modification of Materials, Elsevier, 1994, Pages 581-583 ISBN 9780444819949,

https://doi.org/10.1016/B978-0-444-81994-9.50121-4 (link)

Analytical expressions for sputter and diffusion-modified ion implantation profiles, J. Martan, Materials Science and Engineering: B, Volume 22, Issues 2–3, (1994) Pages L1-L4 ISSN 0921-5107

https://doi.org/10.1016/0921-5107(94)90265-8 (link)

Analysis of diamond and diamondlike thin films using neutron depth profiling, Lamaze, G.P., Transactions of the American Nuclear Society; Volume: 71; Winter meeting of the American Nuclear Society , Washington, DC (United States), 13-18 Nov 1994

ISSN 0003-018X

Nitrogen depth profiling using recoil-nucleus time-of-flight spectrometry, Welsh, J.F. Jr., and Schweikert, E.A., Transactions of the American Nuclear Society; Volume: 71; Winter meeting of the American Nuclear Society , Washington, DC (United States), 13-18 Nov 1994

ISSN 0003-018X

1993 Literature

Studies in neutron depth profiling, J. F. Welsh, W. D. James, E. A. Schweikert and H. G. McWhinney, Journal of Radioanalytical and Nuclear Chemistry Vol. 167, No. 1, (1993) Pages 111 - 119

Diffusion of lithium-6 isotopes in lithium aluminate ceramics using neutron depth profiling, Hylton G. McWhinney, William D. James, Emile A. Schweikert, John R. Williams, Glen Hollenberg, John Welsh and Washington Sereatan, Journal of Nuclear Materials, Volume 203, Issue 1, 2 July 1993, Pages 43-49

Diffusion into polypropylene of chlorides of alkali metals, V. vor ík, V. Rybka, J. vor íková, V. Hnatowicz, J. Kvítek, J. Vacík, J. ervena and V. Pe ina, European Polymer Journal, Volume 29, Issue 7, July 1993, Pages 923-926

Range measurement of boron isotopes in silicon from 600 keV to 2 MeV, P. Goppelt, J. P. Biersack, B. Gebauer, D. Fink, W. Bohne, M. Wilpert and Th. Wilpert, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volumes 80-81, Part 1, 3 June 1993, Pages 62-64

Neutron depth profiling by large angle coincidence spectrometry, V. Havránek, V. Hnatowicz, J. Kvítek, J. Vacík and J. Hoffmann, D. Fink, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volume 73, Issue 4, 1 April 1993, Pages 523-530

The Spatial Resolution of Water Diffusion and Trapping in Silicate-Glass Thin Films by Micro-FTIR and Neutron Depth Profiling, J. Neal Cox and Keith Hwang, CVD-XII: proceedings of the Twelfth International Symposium on Chemical Vapor Deposition, 1993 Electrochemical Society, Vol. 93, (2) of Proceedings Series, Editors Klavs F. Jensen, Glenn Wherry Cullen, ISBN 1566770742, 9781566770743, Pages 336-340

Analysis of boron in CVD diamond surfaces using neutron depth profiling, G. P. Lamaze and R. G. Downing, L. Pilione, A. Badzian and T. Badzian, Applied Surface Science, Volumes 65-66, 2 March 1993, Pages 587-592

Characterization of Doped Diamond-like Carbon Films and Multilayers, Hofsäss, H.C., Biegel, J., Ronning, C., Downing, R.G., and Lamaze,G. P., Proceedings of the Materials Research Society, Boston Vol 316 pages 881-886 (1993)

Neutron Depth Profiling: Overview of the NIST Facilities, Downing, R.G., and Lamaze, G.P., Langland, J.K., and Hwang, S.T., NIST Journal of Research, 98(1) (1993) pages 109-126

Neutron Depth Profiling Technique and Facilities, Downing, R.G., and Lamaze, G.P., Neutron News, 4(1) (1993) pages 15-20

Depth-Distribution of Lithium in Oxidized Binary Aluminum-Lithium Alloys Determined by Secondary Ion Mass Spectrometry and Neutron Depth Profiling, Soni, K.K., Williams, D.B., Newbury, D.E., Chi, P., Downing, R.G., and Lamaze, G.P., Corrosion, 49, (1993) pages 34-41

Ion tracks in condensed carbonaceous matter, D. Fink, L. T. Chadderton, S. A. Cruz, W. R. Fahrner, V. Hnatowicz, E. H. Te Kaat, A. A. Melnikov, V. S. Varichenko, and A. M. Zaitsev, Radiation Effects and Defects in Solids: Incorporating Plasma Science and Plasma Technology, Volume 126, Issue 1-4, (1993) pages 247-250

Advances in the Methods for Characterization of BPSG Films, R. Carpio, G.P. Lamaze, and R. G. Downing, Proceedings of the Symposia on "Reliability for Semiconductor Devices, Interconnects, and Insulator Materials," Eds. H.S. Rathbone, R.A. Susko, and M. Kashiwagi, The Electrochemical Society, Proceedings Vol. 93-25, pages 40-51 (1993)