Evolution of NDP Development

A (partial) list of publications that present advances to the NDP technique (list in progress)

"Operando Neutron Depth Profiling to Determine the Spatial Distribution of Li in Li-ion Batteries," Frontiers in Energy Research," Tomas W. Verhallen, Shasha Lv, and Marnix Wagemaker, Vol. 6, Article 62, 11 pages July (2018)

https://doi.org/10.3389/fenrg.2018.00062

"High resolution imaging of 2D distribution of lithium in thin samples measured with multipixel detectors in sandwich geometry," I. Tomandl, J. Vacik, Y. Mora Sierra, C. Granja, And V. Kraus, Review of Scientific Instruments, 88, 023706 (7 pages) February (2017)

http://dx.doi.org/10.1063/1.4977217

3D mapping of lithium in battery electrodes using neutron activation, Yuping He, R .Gregory Downing, Howard Wang, Journal of Power Sources, Volume 287, Pages 226-230, 1 August (2015)

doi:10.1016/j.jpowsour.2015.03.176

Design, Construction, and Characterization of a Neutron Depth Profiling Facility at the Oregon State University TRIGA Reactor, Robinson, Joshua A. (2012) Ph. D. Thesis, Oregon State University, Corvallis, OR, U.S.A.

Neutron focusing using capillary optics and its applications to elemental analysis, H. H. Chen-Mayer, D. F. R. Mildner, G. P. Lamaze, R. L. Paul, and R. M. Lindstrom, American Institute of Physics Conference Proceedings 475, pp. 718-721 (1999)

https://doi.org/10.1063/1.59218 (link)

Ion transmission – new technique for analysis of ion tracks in polymers, J. Vacik, J. Cervena, V. Hnatowicz, D. Fink, P. Yu. Apel and P. Strauss Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volume 146, Issues 1-4, 2 December 1998, Pages 475-479

Pulse-shape discrimination in Neutron Depth Profiling Radioanalytical Methods. Part II, J. Vacik, J. Cervena, V. Hnatowicz, V. Havranek, J. Hoffman, Czechoslovak Journal of Physics, Vol. 49 Suppl. S1, pp 417-422 (1999)

Pulse-shape discrimination in neutron depth profiling technique, J. Vacík, J. Cervená, V. Hnatowicz, V. Havránek, J. Hoffmann, S. Po ta, D. Fink and R. Klett, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volume 142, Issue 3, July 1998, Pages 397-401

An old-new tool for nuclear analysis: Time-of-Flight Spectrometry. Schweikert, E.A., Welsh Jr., J. F., Journal of Radioanalytical and Nuclear Chemistry, Vol. 215, No. 1(1997) pages 23-30

Dietmar Fink, Neutron Depth Profiling, HMI-B 539 (1996) Hahn-Meitner-Institut, Berlin, Pages 311, Nr: FD/96/036 (http://d-nb.info/948247029) - This is perhaps the single most comprehensive reference on the topic of NDP.

On the three-dimensional shapes of ion implantation distributions, , D. Fink and M. Müller, Surface and Coatings Technology, Volume 51, Issues 1-3, 15 April 1992, Pages 352-35

Neutron Depth Profiling by Coincidence Spectrometry, Parikh, N.R., Frey, E.C., Hofsäss, Swanson, M.L., Downing, R.G., Hossain, T.Z., and Chu, W.K., Nucl. Instrum. Meth. B45 (1990) 70-74

Large Angle Coincidence Spectrometry for Neutron Depth Profiling, Chu, W. K. (1989). Radiation Effects and Defects in Solids 108, 125-126

Scattering Recoil Coincidence Spectrometry,Chu, W. K., and Wu, D. T. (1988). Nuclear Instruments and Methods B35, 518-521.

Reconstruction of submicron size spatial distributions of implanted particles in solids by computer tomography, M. Müller and D. Fink, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volume 34, Issue 2, August 1988, Pages 162-165

Background reduction in light element depth profiling by a coincidence technique, D. Fink, J. P. Biersack, C. Stumpff, and S. Schlosser, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volume 15, Issues 1-6, 1 April 1986, Pages 740-743,

Background in (n,p), and (n,a) Spectrometry. Fink, D., Biersack, J. P., and Liebl, H. (1983). In Ion Implantation: Equipment, and Techniques, H. Ryssel, and H. Glawischnig, eds., Berlin, Springer-Verlag, pp. 318-326

The use of neutron induced reactions for light element profiling and lattice localization, J. P. Biersack, D. Fink, R. Henkelmann and K. Müller, Nuclear Instruments and Methods, Volume 149, Issues 1-3, 15 February-1 March 1978, Pages 93-97

Ziegler, J. F., Cole, G. W., and Baglin, J. E. E. (1972) Techniques for Determining Concentration Profiles of Boron Impurities in Substrates. Journal of Applied Physics 43(9). 3809-3815

Ziegler, J. F., Crowder, B. L., Cole, G. W., Baglin, J. E. E., and Masters, B. J. (1972) Boron Atom Distributions in Ion-Implanted Silicon by the (n,4He) Nuclear Reaction. Applied Physics Letters 21, 16-17

D. Fink, Ph. D. (1974) Die Verwendung von (n, p) - und (n, Alpha )-Reaktionen für die Messung von Reichweite- und Diffusionsprofilen und Channeling- und Blocking-Effekten, (in German) Thesis No. HO3, 0833, Freie Universität, Berlin 98 pages (http://d-nb.info/760729565)