NDP References for 1991 - 1992

1991 Literature

On the correlation of implantation defects and implanted species, Joachim Bollmann, Heinz A. Klose, Jorg Rohrich, Winfried Frentrup and Axel Mertens, Microchimica Acta, Vol (107) (3-6) pages 179-187 (1992)

External oxidation of aluminium-lithium alloys, Dietmar Fink, V. Hnatowicz, J. Kvitek, V. Havranek, and J. T. Zhou, Surface and Coatings Technology, Volume 51, Issues 1-3, 15 April 1992, Pages 57-64

On the three-dimensional shapes of ion implantation distributions, , D. Fink and M. Müller, Surface and Coatings Technology, Volume 51, Issues 1-3, 15 April 1992, Pages 352-357

20 keV—40 MeV lithium implantation profiles in aluminium, L. Wang, K. Tjan, D. Fink, P. Goppelt, M. Briére, and J. P. Biersack, Surface and Coatings Technology, Volume 51, Issues 1-3, 15 April 1992, Pages 372-378

Helium-3 Behavior in Some Nickel-Based Amorphous Alloys, Kenan Ünlü & Dietrich H. Vincent (1992) Nuclear Science and Engineering, Vol. 110:4, pp. 386-393

DOI: 10.13182/NSE92-A23912(link)

Implantation of polymers at medium ion fluences: a spatial heterogeneity of radiation damage due to dominant electronic stopping, D. Fink, M. Müller, A. Schmoldt, J. K. ZhouL. T. Chadderton, and X. L. Xu, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volume 65, Issues 1-4, 1 March 1992, Pages 432-437

A Cross-Validation Procedure for Stopping the EM Algorithm, and Deconvolution of Neutron Depth Profiling Spectra, Coakley, K. J. (1991). IEEE Transactions on Nuclear Science 38(l), 9-15

Nondestructive Determination of Weight Percent Boron in Dielectric Films, Downing, R.G., and Lamaze, G.P., Trans. Am. Nucl. Soc., 65 (1992) 171-172

The New Cold Neutron Depth Profiling Instrument at NIST, Lamaze, G.P., Downing R.G., Langland, J.K., and Hwang, S.T., J. Radioanal. Nucl. Chem., 160 (21) (1992) 315-325

Neutron depth profiling, Fink D, in: Gawlik, D. [Hrsg.] ; Robertson, T. [Hrsg.] Irradiation devices at the upgraded Research Reactor BER II. Berlin: Hahn-Meitner Institut, 1992. Pages 17-18 (HMI-B 498) Nr: 3.2/92/037

Depth profile measurement device, Fink D., in: Gawlik, D. [Hrsg.] ; Robertson, T. [Hrsg.] Irradiation devices at the upgraded Research Reactor BER II. Berlin: Hahn-Meitner-Institut, 1992. Pages 29-31. (HMI-B 498) Nr: 3.2/92/038

1992 Literature

Hwang, S., Park, T.S., Downing, R.G., Lamaze, G.P., Chang, C.G., Song, J.Y., “¹⁰B Surface Contamination for CdTe by the Cold Neutron Depth Profiling Technique,” J. of Korean Society of Analytical Science, 4 (1991) 241

Coakley, K. J. "A Cross-Validation Procedure for Stopping the EM Algorithm, and Deconvolution of Neutron Depth Profiling Spectra." IEEE Transactions on Nuclear Science 38(1) 9-15 (1991)