NDP References for 2007 - 2008

2008 Literature


  • “Advancement of light-element neutron depth profiling at the University of Texas,” S. M. Whitney, R. G. Downing, S. Biegalski, D. S. O’Kelly, Journal of Radioanalytical and Nuclear Chemistry, Vol 276 (1) pages 257-261 (2008)


  • "Improved adhesion, growth and maturation of human bone-derived cells on nanocrystalline diamond films," Milan Kopecek, Lucie Bacakova, Jiri Vacik, Frantisek Fendrych, Vladimir Vorlicek, Ireana Kratochvilova, Vera Lisa, Emilie Van Hove, Christine Mer, Philippe Bergonzo, Milos Nesladek, Phisica Status Solidi (a) Vol. 205 (9) pp 2145-2153 September (2008)


  • "Magnetron sputtered Si–B–C–N films with high oxidation resistance and thermal stability in air at temperatures above 1500C," Jaroslav Vlček, Stanislav Hřeben, Jiří Kalaš, Jiří Čapek, Petr Zeman, Radomír Čerstvý, Vratislav Peřina and Yuichi Setsuhara, J. Vac. Sci. Technol. A 26, 1101 (2008) http://dx.doi.org/10.1116/1.2949232


  • "Fabrication and Materials for a Longe Range Neutron-Gamma Monitor Using Straw Detectors," Jeffrey L. Lacy, Christopher S. Martin, Liang Sun, Tom D. Lyons, 2008 IEEE Nuclear Science Symposium Conference Record, SD4-3, pp 686-691 (2008)


  • "Development and applications of time-of-flight neutron depth profiling (TOF-NDP)," S. M. Cetiner, K. Unlu, R. G. Downing, Journal of Radioanalytical and Nuclear Chemistry, Vol. 276(3) pp 623-630 (2008)


  • "Development of a Novel Ion Time-of-Flight Spectrometer for Neutron Depth Profiling," Sacit M. Cetiner, Rudolph Tromp, Michael S. Gordon, Kenan Ünlü, Jack S. Brenizer, Trans. Am. Nucl. Soc., Vol. 98(1) pp. 414-415 June (2008)


  • "Neutron Depth Profiling of Cathode Materials from Lithium Ion Cells," Scott M. Whitney, Yunhui Huang, Steve Biegalski, Trans. Am. Nucl. Soc., Vol. 98(1) pp. 418-419 June (2008)


  • “Modifications to the UT-NDP System,” Scott M. Whitney, Steve Biegalski, Sean O'Kelly, Trans. Am. Nucl. Soc., Vol. 98(1) p. 413 June 2008


  • "Development of Time-of-Flight Neutron Depth Profiling at The Pennsylvania State University" S. M. Cetiner, K. Ünlü, R. G. Downing, Trans. Am. Nucl. Soc., Vol. 98(1) pp. 311-312 June (2008)


  • "Cross Electric and Magnetic Field (CEM) Field Spectrometer for Neutron Depth Profiling" Sacit M. Cetiner, Kenan Ünlü, Lei (Raymond) Cao, R. Gregory Downing, Trans. Am. Nucl. Soc., Vol. 98(1) pp. 420-421 June (2008)


  • "The Analysis of Gamma Irradiated Boron-doped Diamond Films by CNDP Using Computerized Data Reduction" Lei R. Cao, Sanju Gupta, R. Gregory Downing, Trans. Am. Nucl. Soc., Vol. 98(1) pp. 423-424 June (2008)


  • "High Dose of Helium Implanted in Nano-Cavity Tungsten to Evaluate Threshold of Surface Blistering due to He Bubble Formation" N. Parikh, R. Parker, R. Downing, L. Cao, Trans. Am. Nucl. Soc., Vol. 98(1) pp. 416-417 June (2008)


  • "Diffusion of Boron in CaF2," Jiri Vacik, Vladimir Hnatowicz, Ulli Köster, Trans. Am. Nucl. Soc., Vol. 98(1) pp.422 June (2008)

2007 Literature

  • “Localised doping of Li-silicate glasses by Er3+ ion exchange to fabricate thin optical layers” Linda Salavcova, Jarmila Spirkova, Martin Mika, Anna Mackova, Jiri Oswald, Anna Langrova, Jiri Vacik, Optical Materials, Volume 29, Issue 7, March 2007, pp. 753-759


  • “Study of anomalous behaviour of LiTaO3 during the annealed proton exchange process of optical waveguide’s formation – comparison with LiNbO3” Linda Salavcova, Jarmila Spirkova, Frantisek Ondracek, Anna Mackova, Jiri Vacik, Ulrich Kreissig, Frank Eichhorn, Rainer Groetzschel, Optical Materials, Volume 29, Issue 7, March 2007, pp. 913-918


  • “Study of damaged depth profiles of ion-irradiated PEEK” J. Vacík, V. Hnatowicz, J. Cervena, P. Apel, S. Posta, Y. Kobayashi, Surface and Coatings Technology, Volume 201, Issues 19-20, 5 August 2007, pp. 8370-8372


  • “Development of time-of-flight neutron depth profiling at Penn State University,” Çetiner, S.; Ünlü, K.; Downing, R., Journal of Radioanalytical and Nuclear Chemistry, Vol. 271, No. 2, Feb. 2007, pp. 275-281(7)


  • “Depth profiling of boron in ultra-shallow junction devices using time-of-flight neutron depth profiling (TOF-NDP)”, Sacit M. Cetiner, Kenan Unlu, Nuclear Instruments and Methods in Physics Research A 579 (2007) pp. 148–152


  • "Development of Certified References Material of Ion-Implanted Dopants in Silicon for Calibration of Secondary Ion Mass Spectrometers," Simons, D.S., Downing, R. G., Lamaze, G. P., Lindstrom, R. M., Greenberg, R. R., Paul, R. L., Schiller, S. B., and Guthrie, W. F., Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, Vol 25 (4) pages 1365-1375 (2007)


  • "Effect of implanted argon on hardness of novel magnetron sputtered Si–B–C–N materials: experiments and ab initio simulations," J Houˇska, J Kalaˇs, J Vlˇcek, M M M Bilek and D R McKenzie, J. Phys.: Condens. Matter 19 (2007) 196228 (13pp)


  • "Study of anomalous behaviour of LiTaO3 during the annealed proton exchange process of optical waveguide’s formation – comparison with LiNbO3," Linda Salavcova, Jarmila Spirkova, Frantisek Ondracek, Anna Mackova, Jiri Vacik, Ulrich Kreissig, Frank Eichhorn and Rainer Groetzschel, Optical Materials, Vol 29 (7) pages 913-918 (2007)


  • "Localised doping of Li-silicate glasses by Er3+ ion exchange to fabricate thin optical layers," Linda Salavcova, Jarmila Spirkova, Martin Mika, Anna Mackova, Jiri Oswald, Anna Langrova and Jiri Vacik, Optical Materials, Vol 29 (7) pages 753-759 March (2007)


  • “Helium Retention in Nano-Cavity Tungsten Implanted with Helium Threat Spectrum Mimicking IFE Reactor Conditions,” R. G. Downing, R. Parker, R. Scelle, N. Parikh, Trans. Am. Nucl. Soc., Vol. 97(1) pp. 317-318 November 2007


  • "Thermal helium desorption of helium-implanted iron," Xu, D., Wirth, B., International Conference on Fusion Reactor Materials; Nice (France); 10-14 Dec 2007; INIS-FR-09-0880 (Abstract)


  • "Influence of substrate bias voltage on structure and properties of hard Si–B–C–N films prepared by reactive magnetron sputtering," J. Houška, J. Vlček, Š. Potocký, V. Peřina, Diamond and Related Materials, Volume 16, Issue 1, 2007, Pages 29-36

ISSN 0925-9635, https://doi.org/10.1016/j.diamond.2006.03.012


  • "Bonding statistics and electronic structure of novel Si–B–C–N materials: Ab initio calculations and experimental verification," Jiří Houška; Jiří Čapek; Jaroslav Vlček; M. M. M. Bilek, McKenzie, D. R., Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 25, Iss. 5, September 2007, pp. 1411-1416.

doi:10.1116/1.2764081